How can surface form accuracy and surface quality be measured?
We have a comprehensive suite of inspection methods:
① Surface‑profile interferometer: used to measure flatness (PV and RMS values).
② Surface defect inspection: under standard illumination, compare against reference samples to detect scratches and pitting in accordance with U.S. military standard MIL or Chinese national standard GB.
③ Thickness/parallelism measurement: employ dial indicators or laser thickness gauges to monitor dimensional consistency.
We have a comprehensive suite of testing capabilities:
① Surface‑profile interferometer: used to measure flatness (PV value, RMS value).
② Surface defect inspection: Compare with a standard reference sample under standardized lighting to detect scratches and pitting (in accordance with U.S. military standard MIL or Chinese national standard GB).
③ Thickness/Parallelism Measurement: Use a dial indicator or a laser thickness gauge to monitor thickness uniformity.
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Exhibition Dates: September 9–11, 2026
Exhibiting Company: Suzhou Youwei Optoelectronics Technology Co., Ltd.
Booth Number: Infrared Technology and Applications Exhibition, Hall 8, Booth 8D20
Products on Display: Germanium polishing wafers, silicon polishing wafers, precision optical components, precision drilled optical components, and more.